與倪PXI-6255(零件號:779547-01)PXI多功能輸入輸出模塊，用戶可以將內(nèi)部或外部周期時鐘信號(具有已知周期)發(fā)送到輸入計數(shù)器源。當(dāng)門信號中的脈沖有效時，計數(shù)器計數(shù)源信號中上升(或下降)沿的數(shù)量。在脈沖寬度估計中，計數(shù)器測量其門輸入信號上的脈沖寬度。用戶可以設(shè)置計數(shù)器來量化門信號上高脈沖或低脈沖的寬度。

這PXI-6255多功能輸入/輸出模塊與NI SCC和SCXI信號調(diào)理平臺兼容，可為任何類型的傳感器提供放大、濾波和電源。這些平臺還符合IEEE 1451.4智能傳感器電子數(shù)據(jù)手冊(TEDS)的要求，為傳感器數(shù)據(jù)手冊中的信息提供數(shù)字存儲。

這鎳PXI-6255 M系列設(shè)備可與NI LabVIEW SignalExpress交互式測量軟件一起使用，將臺式測量傳送到PC。通過LabVIEW SignalExpress基于配置的交互式步驟，用戶可以快速創(chuàng)建設(shè)計驗證測試。高速M(fèi)系列器件的快速采集和生成速率，以及LabVIEW SignalExpress提供實時設(shè)計分析。用戶可以將其經(jīng)過測試和驗證的LabVIEW SignalExpress項目轉(zhuǎn)換為LabVIEW應(yīng)用程序，以便立即用于DAQ，從而縮小測試、控制和設(shè)計應(yīng)用程序之間的差距。

With the NI PXI-6255 (Part Number: 779547-01) PXI Multifunction I/O Module, the user can route an inward or outside periodic clock signal (with a known period) to the input counter source. The counter counts the quantity of rising (or falling) edges in the source signal while the pulse in the Gate Signal is active. In pulse width estimations, the counter measures the width of a pulse on its Gate input signal. The user can arrange the counter to quantify the width of high pulses or low pulses on the Gate signal.

The PXI-6255 Multifunction I/O Module is compatible with NI SCC and SCXI signal conditioning platforms, which provide amplification, filtering, and power for any type of sensor. These platforms also comply with the electronic data sheet (TEDS) sensors of the IEEE 1451.4 smart transducer, which provides digital storage for information from the sensor datasheet.

The NI PXI-6255 M Series device can be used with NI LabVIEW SignalExpress interactive measurement software to deliver benchtop measurements to the PC. With LabVIEW SignalExpress interactive configuration-based steps, the user can quickly create design verification tests. The fast acquisition and generation rates of high-speed M Series devices, along with LabVIEW SignalExpress provide on-the-go design analysis. The user can convert their tested and verified LabVIEW SignalExpress projects to LabVIEW applications for immediate DAQ use, thus bridging the gap between test, control, and design applications.